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The self-heating effect has a time constant in the order of a microsecond [45], hence the variation becomes less important for fast switching logic circuits, since the circuit will reach a thermal equilibrium [44, 82]. The characteristics of the devices are then constant. gate source gate drain (a) Bulk CMOS ÙÖ ¾º source drain (b) SOI CMOS Illustration of the heat transfer in (a) bulk CMOS and (b) SOI CMOS. Ì ÖÑ Ð « Ø× Ò Ò ÐÓ Ö
Ù Ø× If analog circuits are considered, the effects of self-heating are more severe than for digital circuits.

The figure of merit can be defined in several ways [29, 64, 93]. 5 ERBW Input frequency ÙÖ ¿º Illustration of the effective resolution bandwidth. 13) which yields the energy per conversion step. ¿º Ð × ÌÓÔÓÐÓ Ý High speed ADCs are often based on a flash structure [41, 85, 88]. In an N -bit flash ADC, the input signal is applied to the inputs of 2N − 1 comparators, where N is the resolution of the converter. Each comparator is connected to a reference voltage that commonly is generated by a resistor net.

To compensate for mismatch errors both static as well as dynamic matching techniques can be employed [74]. , to reduce the variation between the components [18, 82]. A complementary approach is DEM, which has been used for a couple of decades in digital-to-analog converters (DACs) [88]. It has been used in stand alone DACs as well as DACs used in ADCs [3, 26, 34, 46]. In the past years some attempts have been made to introduce DEM in ADCs as well, such as pipelined ADCs [63], sigma-delta ADCs [26], and flash ADCs [6, 7, 73].

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