Download Microcantilevers for Atomic Force Microscope Data Storage by Benjamin W. Chui PDF
By Benjamin W. Chui
Microcantilevers for Atomic strength Microscope information Storage describes a study collaboration among IBM Almaden and Stanford college during which a brand new mass info garage expertise was once evaluated. This know-how relies at the use of heated cantilevers to shape submicron indentations on a polycarbonate floor, and piezoresistive cantilevers to learn these indentations.
Microcantilevers for Atomic strength Microscope information Storage describes how silicon micromachined cantilevers can be utilized for high-density topographic facts garage on an easy substrate reminiscent of polycarbonate. The cantilevers will be made to include resistive warmers (for thermal writing) or piezoresistive deflection sensors (for facts readback).
the first viewers for Microcantilevers for Atomic ForceMicroscope info Storage is commercial and educational employees within the microelectromechanical structures (MEMS) zone. it is going to even be of curiosity to researchers within the information garage who're investigating destiny garage technologies.
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Extra resources for Microcantilevers for Atomic Force Microscope Data Storage
Example text
At these temperatures the heater should start to glow. Indeed, this prediction was found to be true: light from the cantilever was visible to the naked eye during the measurements. Fig. 11 shows an optical photograph of a glowing hot heater-cantilever taken with its own light. 2 . - - . --. o 2000 1800 1600 1400 1200 1000 800 600 400 20: - (b) Estimated Temperature .......... ~ .............. -..... ' ...... ' 6 4 2 0 ..... (c) _ ............. - ..... _................ . - .... cantilever legs 4 2 o --- Estimated Intrinsic carrier concentration ~ 16 14 12 10 8 6 ~ 20 18 16 14 I : 12 0 ....
43]. A comparison of the various exploratory data storage approaches is shown in Fig. 2. Latest performance figures for magnetic and optical storage are included for reference as well. 2 Comparison of different approaches to data storage. Bit areal density is plotted against data rate. Note that in general, high bit areal density is associated with low data rate, and vice versa (adapted from ref. 8]). 28]. Unlike the other AFM-based technique discussed here (the NOS method, which uses a flat but structured storage medium), this technique relies on topographical features on the surface of a homogeneous substrate, treating the features as data marks.
In addition, ~ is a scaling factor (~< 1) used to account for the effect of heavy doping and microscale dimensions on the thermal conductivity of silicon, as well as the additional effect of conductive cooling through air. 9] that the presence of impurities lowers the thermal conductivity of silicon. 12] (Fig. 9) has confirmed this fact and with more detailed measurements, including information about the thermal conductivity of micron-thick silicon layers. 7) Here, Vlever is simply the voltage applied across the cantilever.